Scrgey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, E. Gornik, G. Groos, M. Stecher. Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability, 41(9-10):1501-1506, 2001.
@article{BychikhinLPPGGS01,
title = {Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures},
author = {Scrgey Bychikhin and Martin Litzenberger and R. Pichler and Dionyz Pogany and E. Gornik and G. Groos and M. Stecher},
year = {2001},
tags = {analysis},
researchr = {https://researchr.org/publication/BychikhinLPPGGS01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1501-1506},
}