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Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures

Scrgey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, E. Gornik, G. Groos, M. Stecher. Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectronics Reliability, 41(9-10):1501-1506, 2001.

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