P. G. Byrnes, F. A. DiazDelaO. Reliability Based Bayesian Inference for Probabilistic Classification: An Overview of Sampling Schemes. In Max Bramer, Miltos Petridis, editors, Artificial Intelligence XXXIV - 37th SGAI International Conference on Artificial Intelligence, AI 2017, Cambridge, UK, December 12-14, 2017, Proceedings. Volume 10630 of Lecture Notes in Computer Science, pages 250-263, Springer, 2017. [doi]
@inproceedings{ByrnesD17,
title = {Reliability Based Bayesian Inference for Probabilistic Classification: An Overview of Sampling Schemes},
author = {P. G. Byrnes and F. A. DiazDelaO},
year = {2017},
doi = {10.1007/978-3-319-71078-5_22},
url = {https://doi.org/10.1007/978-3-319-71078-5_22},
researchr = {https://researchr.org/publication/ByrnesD17},
cites = {0},
citedby = {0},
pages = {250-263},
booktitle = {Artificial Intelligence XXXIV - 37th SGAI International Conference on Artificial Intelligence, AI 2017, Cambridge, UK, December 12-14, 2017, Proceedings},
editor = {Max Bramer and Miltos Petridis},
volume = {10630},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-319-71078-5},
}