P. G. Byrnes, F. A. DiazDelaO. Reliability Based Bayesian Inference for Probabilistic Classification: An Overview of Sampling Schemes. In Max Bramer, Miltos Petridis, editors, Artificial Intelligence XXXIV - 37th SGAI International Conference on Artificial Intelligence, AI 2017, Cambridge, UK, December 12-14, 2017, Proceedings. Volume 10630 of Lecture Notes in Computer Science, pages 250-263, Springer, 2017. [doi]
Abstract is missing.