Yunseon Byun, Jun-Geol Baek. Mixed Pattern Recognition Methodology on Wafer Maps with Pre-trained Convolutional Neural Networks. In Ana Paula Rocha 0001, Luc Steels, H. Jaap van den Herik, editors, Proceedings of the 12th International Conference on Agents and Artificial Intelligence, ICAART 2020, Volume 2, Valletta, Malta, February 22-24, 2020. pages 974-979, SCITEPRESS, 2020. [doi]
Abstract is missing.