Taejoon Byun, Sanjai Rayadurgam, Mats P. E. Heimdahl. Black-Box Testing of Deep Neural Networks. In Zhi Jin, Xuandong Li, Jianwen Xiang, Leonardo Mariani, Ting Liu, Xiao Yu, Nahgmeh Ivaki, editors, 32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021, Wuhan, China, October 25-28, 2021. pages 309-320, IEEE, 2021. [doi]
@inproceedings{ByunRH21,
title = {Black-Box Testing of Deep Neural Networks},
author = {Taejoon Byun and Sanjai Rayadurgam and Mats P. E. Heimdahl},
year = {2021},
doi = {10.1109/ISSRE52982.2021.00041},
url = {https://doi.org/10.1109/ISSRE52982.2021.00041},
researchr = {https://researchr.org/publication/ByunRH21},
cites = {0},
citedby = {0},
pages = {309-320},
booktitle = {32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021, Wuhan, China, October 25-28, 2021},
editor = {Zhi Jin and Xuandong Li and Jianwen Xiang and Leonardo Mariani and Ting Liu and Xiao Yu and Nahgmeh Ivaki},
publisher = {IEEE},
isbn = {978-1-6654-2587-2},
}