Taejoon Byun, Sanjai Rayadurgam, Mats P. E. Heimdahl. Black-Box Testing of Deep Neural Networks. In Zhi Jin, Xuandong Li, Jianwen Xiang, Leonardo Mariani, Ting Liu, Xiao Yu, Nahgmeh Ivaki, editors, 32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021, Wuhan, China, October 25-28, 2021. pages 309-320, IEEE, 2021. [doi]
Abstract is missing.