Bora Caglayan, Ayse Tosun Misirli, Gul Calikli, Ayse Bener, Turgay Aytac, Burak Turhan. Dione: an integrated measurement and defect prediction solution. In Will Tracz, Martin P. Robillard, Tevfik Bultan, editors, 20th ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE-20), SIGSOFT/FSE'12, Cary, NC, USA - November 11 - 16, 2012. pages 20, ACM, 2012. [doi]
@inproceedings{CaglayanMCBAT12,
title = {Dione: an integrated measurement and defect prediction solution},
author = {Bora Caglayan and Ayse Tosun Misirli and Gul Calikli and Ayse Bener and Turgay Aytac and Burak Turhan},
year = {2012},
doi = {10.1145/2393596.2393619},
url = {http://doi.acm.org/10.1145/2393596.2393619},
researchr = {https://researchr.org/publication/CaglayanMCBAT12},
cites = {0},
citedby = {0},
pages = {20},
booktitle = {20th ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE-20), SIGSOFT/FSE'12, Cary, NC, USA - November 11 - 16, 2012},
editor = {Will Tracz and Martin P. Robillard and Tevfik Bultan},
publisher = {ACM},
isbn = {978-1-4503-0443-6},
}