12Gbps SerDes Jitter Tolerance BIST in production loopback testing with enhanced spread spectrum clock generation circuit - researchr publication authors

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Yi Cai, Liming Fang, Ivan Chan, Max Olsen, Kevin Richter. 12Gbps SerDes Jitter Tolerance BIST in production loopback testing with enhanced spread spectrum clock generation circuit. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-8, IEEE Computer Society, 2013. [doi]

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