Robust closed-loop process identification from step test

Wen-Jian Cai, Yue Fang, Ya-Gang Wang. Robust closed-loop process identification from step test. In 8th International Conference on Control, Automation, Robotics and Vision, ICARCV 2004, Kunming, China, 6-9 December 2004, Proceedings. pages 907-912, IEEE, 2004. [doi]

Abstract

Abstract is missing.