Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Chang Cai, Ze He, Tianqi Liu, Gengsheng Chen, Jian Yu, Liewei Xu, Jie Liu. Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits. IEEE Access, 8:45378-45389, 2020. [doi]
Abstract is missing.