Shuo Cai, Binyong He, Sicheng Wu, Jin Wang 0001, Weizheng Wang, Fei Yu 0009. An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation. J. Electronic Testing, 38(2):165-180, 2022. [doi]
@article{CaiHWWWY22,
title = {An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation},
author = {Shuo Cai and Binyong He and Sicheng Wu and Jin Wang 0001 and Weizheng Wang and Fei Yu 0009},
year = {2022},
doi = {10.1007/s10836-022-05996-y},
url = {https://doi.org/10.1007/s10836-022-05996-y},
researchr = {https://researchr.org/publication/CaiHWWWY22},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {38},
number = {2},
pages = {165-180},
}