Exploring Active Learning for Semiconductor Defect Segmentation - researchr publication authors

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Lile Cai, Ramanpreet Singh Pahwa, Xun Xu, Jie Wang, Richard Chang 0002, Lining Zhang, Chuan-Sheng Foo. Exploring Active Learning for Semiconductor Defect Segmentation. In 2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022. pages 1796-1800, IEEE, 2022. [doi]

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