Lile Cai, Ramanpreet Singh Pahwa, Xun Xu, Jie Wang, Richard Chang 0002, Lining Zhang, Chuan-Sheng Foo. Exploring Active Learning for Semiconductor Defect Segmentation. In 2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022. pages 1796-1800, IEEE, 2022. [doi]
@inproceedings{CaiPXW0ZF22,
title = {Exploring Active Learning for Semiconductor Defect Segmentation},
author = {Lile Cai and Ramanpreet Singh Pahwa and Xun Xu and Jie Wang and Richard Chang 0002 and Lining Zhang and Chuan-Sheng Foo},
year = {2022},
doi = {10.1109/ICIP46576.2022.9897842},
url = {https://doi.org/10.1109/ICIP46576.2022.9897842},
researchr = {https://researchr.org/publication/CaiPXW0ZF22},
cites = {0},
citedby = {0},
pages = {1796-1800},
booktitle = {2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022},
publisher = {IEEE},
isbn = {978-1-6654-9620-9},
}