Chaofeng Cai, Yilong Qu, Qing Guo, Wang Tao, Kuang Sheng. Parameters evaluation for SiC-JFET modeling considering non-uniformity by fabrication. In 21st IEEE International Symposium on Industrial Electronics, ISIE 2012, Hangzhou, China, 28-31 May, 2012. pages 437-441, IEEE, 2012. [doi]
Abstract is missing.