Hairui Cai, Zezhong Wang 0006, Yu Huang 0005, Naixing Wang, Zhouxing Su, Zhipeng Lv. Scan Chain Reordering for Improving Test Coverage with Compression. In 44th IEEE VLSI Test Symposium, VTS 2026, Napa, CA, USA, April 27-29, 2026. pages 1-7, IEEE, 2026. [doi]
Abstract is missing.