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Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration

Hao Cai, You Wang, Lirida Alves de Barros Naviner, Xinning Liu, Weiwei Shan, Jun Yang 0006, Weisheng Zhao. Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration. IEEE Trans. on Circuits and Systems, 66-I(1):239-250, 2019. [doi]

Authors

Hao Cai

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You Wang

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Lirida Alves de Barros Naviner

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Xinning Liu

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Weiwei Shan

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Jun Yang 0006

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Weisheng Zhao

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