Hao Cai, You Wang, Lirida Alves de Barros Naviner, Xinning Liu, Weiwei Shan, Jun Yang 0006, Weisheng Zhao. Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration. IEEE Trans. on Circuits and Systems, 66-I(1):239-250, 2019. [doi]
Abstract is missing.