Xinyuan Cai, Chunheng Wang, Baihua Xiao, Xue Chen, Ji Zhou. Deep nonlinear metric learning with independent subspace analysis for face verification. In Noboru Babaguchi, Kiyoharu Aizawa, John R. Smith, Shin'ichi Satoh, Thomas Plagemann, Xian-Sheng Hua, Rong Yan, editors, Proceedings of the 20th ACM Multimedia Conference, MM '12, Nara, Japan, October 29 - November 02, 2012. pages 749-752, ACM, 2012. [doi]
Abstract is missing.