Jean Paul Caisso, Bernard Courtois. Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 94-101, IEEE Computer Society, 1988.
@inproceedings{CaissoC88,
title = {Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level},
author = {Jean Paul Caisso and Bernard Courtois},
year = {1988},
tags = {testing},
researchr = {https://researchr.org/publication/CaissoC88},
cites = {0},
citedby = {0},
pages = {94-101},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
publisher = {IEEE Computer Society},
}