M. Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 720-728, IEEE Computer Society, 1994.
Abstract is missing.