Simulated shunts as dc low-resistance travelling standards

Luca Callegaro, Cristina Cassiago, Enrico Gasparotto. Simulated shunts as dc low-resistance travelling standards. In 1st IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, RTSI 2015, Torino, Italy, September 16-18, 2015. pages 302-305, IEEE, 2015. [doi]

Abstract

Abstract is missing.