A radiation hardened 512 kbit SRAM in 180 nm CMOS technology

Cristiano Calligaro, Valentino Liberali, Alberto Stabile. A radiation hardened 512 kbit SRAM in 180 nm CMOS technology. In 16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009, Yasmine Hammamet, Tunesia, 13-19 December, 2009. pages 655-658, IEEE, 2009. [doi]

@inproceedings{CalligaroLS09,
  title = {A radiation hardened 512 kbit SRAM in 180 nm CMOS technology},
  author = {Cristiano Calligaro and Valentino Liberali and Alberto Stabile},
  year = {2009},
  doi = {10.1109/ICECS.2009.5410804},
  url = {http://dx.doi.org/10.1109/ICECS.2009.5410804},
  researchr = {https://researchr.org/publication/CalligaroLS09},
  cites = {0},
  citedby = {0},
  pages = {655-658},
  booktitle = {16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009, Yasmine Hammamet, Tunesia, 13-19 December, 2009},
  publisher = {IEEE},
  isbn = {978-1-4244-5090-9},
}