Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski. Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 319-324, IEEE Computer Society, 2000. [doi]

Authors

José Vicente Calvano

This author has not been identified. Look up 'José Vicente Calvano' in Google

Vladimir Castro Alves

This author has not been identified. Look up 'Vladimir Castro Alves' in Google

Marcelo Lubaszewski

This author has not been identified. Look up 'Marcelo Lubaszewski' in Google