Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus - researchr publication authors

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José Vicente Calvano, Vladimir Castro Alves, Antônio C. Mesquita, Marcelo Lubaszewski. Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 201-206, IEEE Computer Society, 2002. [doi]

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