Circuit simulation of workload-dependent RTN and BTI based on trap kinetics

Vinicius V. A. Camargo, Ben Kaczer, Tibor Grasser, Gilson I. Wirth. Circuit simulation of workload-dependent RTN and BTI based on trap kinetics. Microelectronics Reliability, 54(11):2364-2370, 2014. [doi]

Abstract

Abstract is missing.