Michael Campbell. The Future of Test - Product Integration and its Impact on Test. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 3, IEEE Computer Society, 2009. [doi]
@inproceedings{Campbell09-0,
title = {The Future of Test - Product Integration and its Impact on Test},
author = {Michael Campbell},
year = {2009},
doi = {10.1109/DFT.2009.67},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2009.67},
tags = {testing},
researchr = {https://researchr.org/publication/Campbell09-0},
cites = {0},
citedby = {0},
pages = {3},
booktitle = {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA},
editor = {Dimitris Gizopoulos and Susumu Horiguchi and Spyros Tragoudas and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}