High-resolution recovery of spatial reflectivity maps in Harsh remote sensing scenarios: A metrically structured experiment design regularization approach

Gustavo D. Martin del Campo, Yuriy V. Shkvarko, Juan I. Yanez. High-resolution recovery of spatial reflectivity maps in Harsh remote sensing scenarios: A metrically structured experiment design regularization approach. In 23rd International Conference on Electronics, Communications and Computing, CONIELECOMP 2013, Cholula, Puebla, Mexico, March 11-13, 2013. pages 225-229, IEEE, 2013. [doi]

Abstract

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