Toroidal Constraints for Two-Point Localization Under High Outlier Ratios

Federico Camposeco, Torsten Sattler, Andrea Cohen, Andreas Geiger, Marc Pollefeys. Toroidal Constraints for Two-Point Localization Under High Outlier Ratios. In 2017 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017, Honolulu, HI, USA, July 21-26, 2017. pages 6700-6708, IEEE Computer Society, 2017. [doi]

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