Toroidal Constraints for Two-Point Localization Under High Outlier Ratios

Federico Camposeco, Torsten Sattler, Andrea Cohen, Andreas Geiger, Marc Pollefeys. Toroidal Constraints for Two-Point Localization Under High Outlier Ratios. In 2017 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017, Honolulu, HI, USA, July 21-26, 2017. pages 6700-6708, IEEE Computer Society, 2017. [doi]

@inproceedings{CamposecoSCGP17,
  title = {Toroidal Constraints for Two-Point Localization Under High Outlier Ratios},
  author = {Federico Camposeco and Torsten Sattler and Andrea Cohen and Andreas Geiger and Marc Pollefeys},
  year = {2017},
  doi = {10.1109/CVPR.2017.709},
  url = {http://doi.ieeecomputersociety.org/10.1109/CVPR.2017.709},
  researchr = {https://researchr.org/publication/CamposecoSCGP17},
  cites = {0},
  citedby = {0},
  pages = {6700-6708},
  booktitle = {2017 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2017, Honolulu, HI, USA, July 21-26, 2017},
  publisher = {IEEE Computer Society},
  isbn = {978-1-5386-0457-1},
}