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Paolo Camurati, Davide Medina, Paolo Prinetto, Matteo Sonza Reorda. A diagnostic test pattern generation algorithm. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 52-58, IEEE Computer Society, 1990. [doi]

This author has not been identified. Look up 'Paolo Camurati' in GoogleThis author has not been identified. Look up 'Davide Medina' in GoogleThis author has not been identified. Look up 'Paolo Prinetto' in GoogleThis author has not been identified. Look up 'Matteo Sonza Reorda' in Google

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