Paolo Camurati, Davide Medina, Paolo Prinetto, Matteo Sonza Reorda. A diagnostic test pattern generation algorithm. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 52-58, IEEE Computer Society, 1990. [doi]
@inproceedings{CamuratiMPR90,
title = {A diagnostic test pattern generation algorithm},
author = {Paolo Camurati and Davide Medina and Paolo Prinetto and Matteo Sonza Reorda},
year = {1990},
doi = {10.1109/TEST.1990.114000},
url = {http://dx.doi.org/10.1109/TEST.1990.114000},
researchr = {https://researchr.org/publication/CamuratiMPR90},
cites = {0},
citedby = {0},
pages = {52-58},
booktitle = {Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990},
publisher = {IEEE Computer Society},
isbn = {0-8186-9064-},
}