Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina. An industrial experience in the built-in self test of embedded RAMs. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 306-311, IEEE Computer Society, 1994. [doi]
@inproceedings{CamuratiPRBBM94,
title = {An industrial experience in the built-in self test of embedded RAMs},
author = {Paolo Camurati and Paolo Prinetto and Matteo Sonza Reorda and Stefano Barbagallo and Andrea Burri and Davide Medina},
year = {1994},
doi = {10.1109/VTEST.1994.292296},
url = {http://dx.doi.org/10.1109/VTEST.1994.292296},
researchr = {https://researchr.org/publication/CamuratiPRBBM94},
cites = {0},
citedby = {0},
pages = {306-311},
booktitle = {12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-5440-6},
}