Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina. An industrial experience in the built-in self test of embedded RAMs. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 306-311, IEEE Computer Society, 1994. [doi]
Abstract is missing.