Riccardo Cantoro, Marco Palena, Paolo Pasini, Matteo Sonza Reorda. Test Time Minimization in Reconfigurable Scan Networks. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 119-124, IEEE Computer Society, 2016. [doi]
@inproceedings{CantoroPPR16,
title = {Test Time Minimization in Reconfigurable Scan Networks},
author = {Riccardo Cantoro and Marco Palena and Paolo Pasini and Matteo Sonza Reorda},
year = {2016},
doi = {10.1109/ATS.2016.58},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.58},
researchr = {https://researchr.org/publication/CantoroPPR16},
cites = {0},
citedby = {0},
pages = {119-124},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}