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Test Time Minimization in Reconfigurable Scan Networks

Riccardo Cantoro, Marco Palena, Paolo Pasini, Matteo Sonza Reorda. Test Time Minimization in Reconfigurable Scan Networks. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 119-124, IEEE Computer Society, 2016. [doi]

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