A New Measurement Circuit to Evaluate Current Collapse Effect of GaN HEMTs Under Practical Conditions

Guoen Cao, Arsalan Ansari, Hee-Jun Kim. A New Measurement Circuit to Evaluate Current Collapse Effect of GaN HEMTs Under Practical Conditions. IEEE T. Instrumentation and Measurement, 64(7):1977-1986, 2015. [doi]

Abstract

Abstract is missing.