LVS check for photonic integrated circuits: curvilinear feature extraction and validation - researchr publication authors

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Ruping Cao, Julien Billoudet, John Ferguson, Lionel Couder, John Cayo, Alexandre Arriordaz, Ian O'Connor. LVS check for photonic integrated circuits: curvilinear feature extraction and validation. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1253-1256, ACM, 2015. [doi]

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