Ruping Cao, Julien Billoudet, John Ferguson, Lionel Couder, John Cayo, Alexandre Arriordaz, Ian O'Connor. LVS check for photonic integrated circuits: curvilinear feature extraction and validation. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1253-1256, ACM, 2015. [doi]
@inproceedings{CaoBFCCAO15,
title = {LVS check for photonic integrated circuits: curvilinear feature extraction and validation},
author = {Ruping Cao and Julien Billoudet and John Ferguson and Lionel Couder and John Cayo and Alexandre Arriordaz and Ian O'Connor},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092582},
researchr = {https://researchr.org/publication/CaoBFCCAO15},
cites = {0},
citedby = {0},
pages = {1253-1256},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}