Learning from testing data: A new view of incremental semi-supervised learning

Yuan Cao, Haibo He. Learning from testing data: A new view of incremental semi-supervised learning. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2008, part of the IEEE World Congress on Computational Intelligence, WCCI 2008, Hong Kong, China, June 1-6, 2008. pages 2872-2878, IEEE, 2008. [doi]

@inproceedings{CaoH08,
  title = {Learning from testing data: A new view of incremental semi-supervised learning},
  author = {Yuan Cao and Haibo He},
  year = {2008},
  doi = {10.1109/IJCNN.2008.4634202},
  url = {http://dx.doi.org/10.1109/IJCNN.2008.4634202},
  tags = {testing, data-flow, incremental},
  researchr = {https://researchr.org/publication/CaoH08},
  cites = {0},
  citedby = {0},
  pages = {2872-2878},
  booktitle = {Proceedings of the International Joint Conference on Neural Networks, IJCNN 2008, part of the IEEE World Congress on Computational Intelligence, WCCI 2008, Hong Kong, China, June 1-6, 2008},
  publisher = {IEEE},
}