Xugang Cao, Hailong Jiao, Erik Jan Marinissen. A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability. IEEE Trans. Circuits Syst. II Express Briefs, 69(2):554-558, 2022. [doi]
@article{CaoJM22,
title = {A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability},
author = {Xugang Cao and Hailong Jiao and Erik Jan Marinissen},
year = {2022},
doi = {10.1109/TCSII.2021.3096885},
url = {https://doi.org/10.1109/TCSII.2021.3096885},
researchr = {https://researchr.org/publication/CaoJM22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. II Express Briefs},
volume = {69},
number = {2},
pages = {554-558},
}