A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability

Xugang Cao, Hailong Jiao, Erik Jan Marinissen. A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability. IEEE Trans. Circuits Syst. II Express Briefs, 69(2):554-558, 2022. [doi]

Abstract

Abstract is missing.