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Yu Cao, Frank Liu. Guest Editors Introduction: Compact Variability Modeling in Scaled CMOS Design. IEEE Design & Test of Computers, 27(2):6-7, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Guest Editors Introduction: Reliability Challenges in Nano-CMOS DesignYu Cao, Jim Tschanz, Pradip Bose. dt, 26(6):6-7, 2009. [doi] Co-Design of Business and IT Systems - Introduction by Guest EditorsKecheng Liu, Lily Sun, Keith H. Bennett. isf, 4(3):251-256, 2002. [doi]
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