A Semi-supervised Defect Detection Method Based on Image Inpainting

Huibin Cao, Yongxuan Lai, Quan Chen, Fan Yang 0010. A Semi-supervised Defect Detection Method Based on Image Inpainting. In Duc Nghia Pham, Thanaruk Theeramunkong, Guido Governatori, Fenrong Liu, editors, PRICAI 2021: Trends in Artificial Intelligence - 18th Pacific Rim International Conference on Artificial Intelligence, PRICAI 2021, Hanoi, Vietnam, November 8-12, 2021, Proceedings, Part III. Volume 13033 of Lecture Notes in Computer Science, pages 97-108, Springer, 2021. [doi]

@inproceedings{CaoLCY21,
  title = {A Semi-supervised Defect Detection Method Based on Image Inpainting},
  author = {Huibin Cao and Yongxuan Lai and Quan Chen and Fan Yang 0010},
  year = {2021},
  doi = {10.1007/978-3-030-89370-5_8},
  url = {https://doi.org/10.1007/978-3-030-89370-5_8},
  researchr = {https://researchr.org/publication/CaoLCY21},
  cites = {0},
  citedby = {0},
  pages = {97-108},
  booktitle = {PRICAI 2021: Trends in Artificial Intelligence - 18th Pacific Rim International Conference on Artificial Intelligence, PRICAI 2021, Hanoi, Vietnam, November 8-12, 2021, Proceedings, Part III},
  editor = {Duc Nghia Pham and Thanaruk Theeramunkong and Guido Governatori and Fenrong Liu},
  volume = {13033},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-030-89370-5},
}