A Semi-supervised Defect Detection Method Based on Image Inpainting

Huibin Cao, Yongxuan Lai, Quan Chen, Fan Yang 0010. A Semi-supervised Defect Detection Method Based on Image Inpainting. In Duc Nghia Pham, Thanaruk Theeramunkong, Guido Governatori, Fenrong Liu, editors, PRICAI 2021: Trends in Artificial Intelligence - 18th Pacific Rim International Conference on Artificial Intelligence, PRICAI 2021, Hanoi, Vietnam, November 8-12, 2021, Proceedings, Part III. Volume 13033 of Lecture Notes in Computer Science, pages 97-108, Springer, 2021. [doi]

Abstract

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