An Auto Chip Package Surface Defect Detection Based on Deep Learning - researchr publication authors

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Yuan Cao 0003, Yubin Ni, You Zhou, Haotian Li, Zhao Huang, Enyi Yao. An Auto Chip Package Surface Defect Detection Based on Deep Learning. IEEE T. Instrumentation and Measurement, 73:1-15, 2024. [doi]

This author has not been identified. Look up 'Yuan Cao 0003' in GoogleThis author has not been identified. Look up 'Yubin Ni' in GoogleThis author has not been identified. Look up 'You Zhou' in GoogleThis author has not been identified. Look up 'Haotian Li' in GoogleThis author has not been identified. Look up 'Zhao Huang' in GoogleThis author has not been identified. Look up 'Enyi Yao' in Google

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