Yuan Cao 0003, Yubin Ni, You Zhou, Haotian Li, Zhao Huang, Enyi Yao. An Auto Chip Package Surface Defect Detection Based on Deep Learning. IEEE T. Instrumentation and Measurement, 73:1-15, 2024. [doi]
@article{CaoNZLHY24,
title = {An Auto Chip Package Surface Defect Detection Based on Deep Learning},
author = {Yuan Cao 0003 and Yubin Ni and You Zhou and Haotian Li and Zhao Huang and Enyi Yao},
year = {2024},
doi = {10.1109/TIM.2023.3347799},
url = {https://doi.org/10.1109/TIM.2023.3347799},
researchr = {https://researchr.org/publication/CaoNZLHY24},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {73},
pages = {1-15},
}