Yuting Cao, Hernan M. Palombo, Sandip Ray, Hao Zheng. Enhancing Observability for Post-Silicon Debug with On-chip Communication Monitors. In 2018 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2018, Hong Kong, China, July 8-11, 2018. pages 602-607, IEEE Computer Society, 2018. [doi]
Abstract is missing.