Sicong Cao, Xiaobing Sun 0001, Wei Liu 0010, Di Wu, Jiale Zhang, Yan Li 0002, Tom H. Luan, Longxiang Gao. EXVul: Toward Effective and Explainable Vulnerability Detection for IoT Devices. IEEE Internet of Things Journal, 11(12):22385-22398, June 2024. [doi]
@article{CaoSLWZLLG24,
title = {EXVul: Toward Effective and Explainable Vulnerability Detection for IoT Devices},
author = {Sicong Cao and Xiaobing Sun 0001 and Wei Liu 0010 and Di Wu and Jiale Zhang and Yan Li 0002 and Tom H. Luan and Longxiang Gao},
year = {2024},
month = {June},
doi = {10.1109/JIOT.2024.3381641},
url = {https://doi.org/10.1109/JIOT.2024.3381641},
researchr = {https://researchr.org/publication/CaoSLWZLLG24},
cites = {0},
citedby = {0},
journal = {IEEE Internet of Things Journal},
volume = {11},
number = {12},
pages = {22385-22398},
}