Sicong Cao, Xiaobing Sun 0001, Wei Liu 0010, Di Wu, Jiale Zhang, Yan Li 0002, Tom H. Luan, Longxiang Gao. EXVul: Toward Effective and Explainable Vulnerability Detection for IoT Devices. IEEE Internet of Things Journal, 11(12):22385-22398, June 2024. [doi]
Abstract is missing.